Wednesday, March 10, 2010
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FTI 1000 Power Discrete Test System

FTI 1000 MOSFET test system consists of independent channel boards that allow all DC and AC MOSFET parameters to be tested either separately, or in one handler insertion or prober touch-down. The MOSFET AC parameters tested by the FTI 1000 include Inductive Load (UIL/UIS), Gate Charge (Qg, Qgs, Qgd), Gate Resistance (Rg), and Switching Tests. FTI 1000 also offers analog test resources to enable Driver-MOSFET devices to be tested, such as products based on the Intel DrMOS standard.

 

 
FTI 2000 Power IC Test System
The FTI 2000 Power IC test system consists of one or more channel boards each populated by up to four instrument modules. FTI's 'Tester-per-Site' architecture based on the USB bus allows one channel board to be dedicated to each handler site. This provides a high degree of system scalability and excellent multisite performance. FTI 2000 can test a wide range of devices, including Power IC's, analog switches and op amps.
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Focused Test, Inc.(FTI) testers are based on a  ‘Tester-per-Site’ design which uses the USB bus to allow easy system scalability for multisite applications. FTI testers can be easily configured to perform parallel tests with many different types of mulitsite handlers, including gravity, turret, strip and wafer ring handlers. FTI’s highly flexible ‘FTI Studio’ software is Dot Net based and has  a multi-threaded architecture which allows our testers to easily perform parallel tests in many different multisite test modes including Index Parallel, with no test-time penalty. 

 

In addition to best-in-class production test performance, the FTI also offers a feature-rich range of software engineering tools. These include Scope Tool, Data Sheet Tool, and a Parts Average Test (PAT) Tool that implements the AEC Q001 Rev C standard.

 

FTI’s unique design approach offers customers a lower cost-of-test per unit, thanks to its extremely low system acquisition price, high multisite throughput, and increased handler productivity.

 
Documents
Product Literature

Please contact us to receive the following product literature:

Instrument Data Sheets:

FTI 1000 DC Instruments

FTI 1000 AC Instruments

FTI 2000

System Specifications

FTI 1000 for Mosfet/IGBT Testing

FTI 1000 for Diode/TVS Testing

White Papers

UIL White Paper

Scope Displays

UIL and Qg Tests

Surge Current Tests

Snap-back Tests

Graphical Displays

 Rg/Cg vs Gate Bias Voltage

 

 

 
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